64‑teilige Chip‑Hoch‑ und Niedertemperatur‑beschleunigte‑Alterungskammer

64‑teilige Chip‑Hoch‑ und Niedertemperatur‑beschleunigte‑Alterungskammer

Merkmale

• Support customization of the number of PCIE test chips, such as 32 chips, 36 chips, 64 chips, 96 chips, 156 chips, 216 chips, etc.;
• Support research and development of micro-miniature customization, such as 4 pieces, 8 pieces, etc.
• Support (-70°~+ 180°) test
• Support abnormal power failure test and aging test
• Support automated temperature control testing;
• Support all intelligent control tests with software;
• Support customization of test software;
• Support the balance of wind speed and temperature in the box;
• Support rapid heating and cooling control;
• Support customized research and development of PCIE aging;
• Support network control, you can control the test in different places and see the test results;
• Support APP remote control test;

The whole machine test system mainly includes high and low temperature box, PC main board, PM board, chip board, FPGA board, product tooling, rear warehouse TEST PC and test software, etc. The hardware part.

SSD intelligent test system overview

The intelligent test system of SSD adopts the Win10 operating system platform, through the open script mode, the temperature of the high and low temperature box and the test items of PCIE products can be modified arbitrarily, and the data transmission is carried out through the LINUX system and the network switch to realize one-button operation, networked control, saving labor, realizing intelligent data management, and permanently retaining test results.