Sistema intelligente portatile di test per chip di memoria flash

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Sistema intelligente portatile di test per chip di memoria flash

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Modello:HD-N8-NAND
Prezzo:FOB, CIF
Pagamento:L/C, D/P, T/T
Confezione:Ogni set è protetto con fibra di resina e pellicola PP, quindi viene inserito in una cassa di legno robusta con manuale d'uso e video all'interno.
Consegna:15 giorni dopo l'ordine.

Sistema intelligente portatile di test per chip di memoria flash

Descrizione del prodotto:

  • The Smart Test System HD-N8-NAND is a comprehensive flash memory test system that can be customized to test up to 8 flash particles in parallel.
  • HD-N8-NAND supports a wide range of test patterns and customized test parameters. It provides a one-click basic test flow, highly flexible experimental test, and advanced test flow, and can It provides one-click basic test flow, highly flexible experimental test and advanced test flow, which can realize various functional tests such as remaining life prediction, the real test, data retention and read disturbance of flash memory particles. The test report can be exported quickly and easily after the completion of the test. It provides the most intuitive graphical test data to provide the most accurate reference for flash particle classification and application. It also provides the most accurate reference for flash particle classification and application and enables intelligent grading based on flash particle quality test results.

Technical specifications:

Physical properties

Dimensioni dell'apparecchiatura W400×H510×D520mm
Power supply method AC
Operating voltage range AC(220±10%)V single-phase 2-wire + protective earth
Normal working power consumption 2KW
Operating temperature range -30℃~150℃
Storage temperature range -20℃~60℃
Operating Humidity Range 45%~75%

System performance

Number of particles that can be tested in parallel 1~8 pcs
Supported flash brands for testing SLC, MLC, TLC, Sandisk, etc. from Micron, Intel, YMTC, Hynix, Toshiba, Sandisk, etc, QLC type NAND Flash chip particles (range is being extended)
Package sizes supported BGA152, BGA132 (custom extensions available)
Supported Flash Protocol Types ONFI/toggle interface particles
Supported Voltage Hardware support V1.2, V1.8 optional
Supported Voltage Pull-Off Range Software support can be fine-tuned vcc2.3~3.6
vccq1.2 1.15~1.25
vccq1.8 1.70~1.95
Supports optional test ranges Individual settings for number of starting blocks, inter-block interval, number of cycles, test time, etc.
Support pattern All 0, all 1, all 5, pseudo-random, checkerboard grid, word line random, etc.
Support for test command types Flash Memory Information Inspection
Flash Memory Performance Testing
Life Testing and Prediction
Quality Class Classification
Data Interference Testing
Data Retention Testing
Read-Retry Functionality
Lifetime Testing and Prediction
ECC Customisation

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