High and Low Temperature Accelerated Aging Chamber 512 Flash Memory Chip Intelligent Test System

Catégorie Testeur de puces

Flash memory chip intelligent test system

Modèle :HD-512-NAND

Prix :FOB, CIF

Paiement :L/C, D/P, T/T

Emballage :Chaque ensemble est protégé par une fibre résineuse et un film PP, puis placé dans un coffre en bois robuste contenant le manuel d’utilisation et une vidéo à l’intérieur.

Livraison :15 jours après la commande.

512 Flash Memory Chip Intelligent Test System

Product Specification

1.Flash memory chip intelligent test system HD-512-NAND is a comprehensive flash memory test system that can customize the test plan and support parallel testing of various types of flash memory particles. 64 types, the maximum number of flash memory particles in parallel testing can reach 512.

Flash memory chip intelligent test system YC-512-NAND supports multiple test patterns and custom test parameter functions, and can provide one-click basic test process and high-level test process with high flexibility, not only can realize the remaining life of flash memory particles, actual measurement , data retention and read interference and other functional tests can also help users verify the reliability status of flash memory particles. After the test is completed, the test report can be easily and quickly exported with one key, providing customers with the most intuitive and accurate graphical test data. Provide the most intuitive data reference for the grade classification and application of flash memory particles, and realize intelligent classification based on the quality inspection results of flash memory particles.

※ The test basis complies with JEDEC Stand No.218: Solid State Technology Association B-2016 Solid-State Drive(SSD) Requirements And Endurance Test Motho;

※ The test basis complies with JEDEC Standard No.47 NVCE: Solid State Technology Association Stress-Test-Driven Qualification of Integrated Circuits;

※ The design specifications of the test board meet the requirements of the industrial-grade test temperature environment;

Information

Dimensions de la boîte intérieure	W760×D400×H890mm
Dimensions de la boîte extérieure	W1870×D890×H1830mm
volume	270 L
Méthode d’ouverture	Single door (right open)
cooling method	air-cooled
poids	about 950KG
Alimentation électrique	AC 380V About 7.5 KW

Système de contrôle

Écran	Color LCD display
Mode de fonctionnement	Program mode, fixed value mode
Setting	Chinese and English menu (optional), touch screen input
Setting range	Temperature: Adjust according to the temperature working range of the equipment (upper limit +5°C, lower limit -5°C)
display resolution	Temperature: 0.01°C Time: 0.01min
Méthode de commande	BTC balanced temperature control method + DCC (intelligent cooling control) + DEC (intelligent electrical control) (temperature test equipment) BTHC balanced temperature and humidity control method + DCC (intelligent cooling control) + DEC (intelligent electrical control) (temperature and humidity test equipment)
Curve record function	It has RAM with battery protection, which can save the set value, sampling value and sampling time of the device; the maximum recording time is 350 days (when the sampling period is 1.5min)
Accessory function	Fault alarm and cause, processing prompt function Power-off protection function Upper and lower limit temperature protection function Calendar timing function (automatic start and automatic stop operation) self-diagnosis function

High and Low Temperature Accelerated Aging Chamber 512 Flash Memory Chip Intelligent Test System