SATA Customized Chip High and Low Temperature Accelerated Aging Chamber 72 Pieces

Kategorie Testér čipů

Inteligentní testovací systém pro pevné disky

Model:HD-72-NVME

Cena:FOB, CIF

Platba:L/C, D/P, T/T

Balení:Každá sada je chráněna pryskyřičným vláknem a PP fólií, poté je vložena do pevné dřevěné bedny spolu s návodem k obsluze a videem uvnitř.

Dodání:15 dní po objednání.

Vlastnost

Support the customization of the number of SATA mass production test pieces, such as 30 pieces, 36 pieces, 42 pieces, 48 pieces, 54 pieces, 72 pieces, 100 pieces, 160 pieces, 200 pieces, etc.;
Support research and development of micro-miniature customization, such as 6 pieces, 12 pieces, etc.;
Support (-70°~+ 180°) test;
Support abnormal power failure test and aging test;
Support automatic temperature control test;
Support all software for intelligent control testing;
Podpora přizpůsobení testovacího softwaru;
Support the balance of air speed and temperature in the box;
Podpora rychlého řízení ohřevu a chlazení;
Support customized research and development of PCIE/EMMC/UFS/DRAM/Flash aging;
Support network control, you can control the test in different places and view the test results;
Support APP remote control testing;

teplotní rozsah	-70℃~150℃
Výkyvy teploty	≤±0,5℃ ≤±1℃
temperature offset	≤±2℃
temperature resolution	0,01 °C
Rychlost ohřevu	5℃/min(mechanical cooling, under standard load)
temperature change rate	High temperature can meet 5℃~8℃/min nonlinear adjustable (measured at the air outlet, mechanical refrigeration, under standard load), low temperature can meet 0℃~2℃/min nonlinear Adjustable (measured at the air outlet, mechanical cooling, under normal load)
temperature uniformity	≤±2℃
standard load	10KG aluminum block, 500W load;

GB/T5170.2-2008 Temperature test equipment

GB/2423.1-2008 (IEC60068-2-1:2007) low temperature test method AB.

GB/2423.2-2008 (IEC60068-2-2:2007) high temperature test method BA.

GJBl50.3 (MIL-STD-810D) high temperature test method.

GJBl50.4 (MIL-STD-810D) low temperature test method.