SATA Customized Chip High and Low Temperature Accelerated Aging Chamber 72 Pieces

Category Chip Tester

Solid State Disk Intelligent Testing System

Model:HD-72-NVME

Price:FOB, CIF

Payment:L/C, D/P, T/T

Package:Each set protected with resin fiber and PP film, then put into Strong wooden case with operation manual and video inside.

Delivery:15 days after order.

Feature

Support the customization of the number of SATA mass production test pieces, such as 30 pieces, 36 pieces, 42 pieces, 48 pieces, 54 pieces, 72 pieces, 100 pieces, 160 pieces, 200 pieces, etc.;
Support research and development of micro-miniature customization, such as 6 pieces, 12 pieces, etc.;
Support (-70°~+ 180°) test;
Support abnormal power failure test and aging test;
Support automatic temperature control test;
Support all software for intelligent control testing;
Support customization of test software;
Support the balance of air speed and temperature in the box;
Support rapid heating and cooling control;
Support customized research and development of PCIE/EMMC/UFS/DRAM/Flash aging;
Support network control, you can control the test in different places and view the test results;
Support APP remote control testing;

temperature range	-70℃~150℃
Temperature fluctuation	≤±0.5℃ ≤±1℃
temperature offset	≤±2℃
temperature resolution	0.01℃
Heating rate	5℃/min(mechanical cooling, under standard load)
temperature change rate	High temperature can meet 5℃~8℃/min nonlinear adjustable (measured at the air outlet, mechanical refrigeration, under standard load), low temperature can meet 0℃~2℃/min nonlinear Adjustable (measured at the air outlet, mechanical cooling, under normal load)
temperature uniformity	≤±2℃
standard load	10KG aluminum block, 500W load;

GB/T5170.2-2008 Temperature test equipment

GB/2423.1-2008 (IEC60068-2-1:2007) low temperature test method AB.

GB/2423.2-2008 (IEC60068-2-2:2007) high temperature test method BA.

GJBl50.3 (MIL-STD-810D) high temperature test method.

GJBl50.4 (MIL-STD-810D) low temperature test method.