SATA Customized Chip High and Low Temperature Accelerated Aging Chamber 72 Pieces

Kategorie Chip-Tester

Intelligentes Testsystem für Solid-State-Disks

Modell:HD-72-NVME

Preis:FOB, CIF

Zahlung:L/C, D/P, T/T

Verpackung:Jedes Set wird mit Harzfasern und PP-Folie geschützt und anschließend in einen stabilen Holzkasten gelegt, der ein Bedienungsmanual und ein Video enthält.

Lieferung:15 Tage nach Auftrag.

Merkmale

Support the customization of the number of SATA mass production test pieces, such as 30 pieces, 36 pieces, 42 pieces, 48 pieces, 54 pieces, 72 pieces, 100 pieces, 160 pieces, 200 pieces, etc.;
Support research and development of micro-miniature customization, such as 6 pieces, 12 pieces, etc.;
Support (-70°~+ 180°) test;
Support abnormal power failure test and aging test;
Support automatic temperature control test;
Support all software for intelligent control testing;
Unterstützung der Anpassung der Testsoftware;
Support the balance of air speed and temperature in the box;
Unterstützt eine schnelle Heiz‑ und Kühlsteuerung;
Support customized research and development of PCIE/EMMC/UFS/DRAM/Flash aging;
Support network control, you can control the test in different places and view the test results;
Support APP remote control testing;

Information

Modell	HD-72-SATA
Größe der Innenbox	W500×D400×H1020mm
Außenboxgröße	About W1250×D1350×H1910mm
volume	204L
Öffnungsart	Single door (right open)
cooling method	air-cooled
Gewicht	About 930KG
Stromversorgung	AC 220V About 12KW

Temperature parameter

Temperaturbereich	-70℃~150℃
Temperaturschwankung	≤±0,5℃ ≤±1℃
temperature offset	≤±2℃
temperature resolution	0,01℃
Heizrate	5℃/min(mechanical cooling, under standard load)
temperature change rate	High temperature can meet 5℃~8℃/min nonlinear adjustable (measured at the air outlet, mechanical refrigeration, under standard load), low temperature can meet 0℃~2℃/min nonlinear Adjustable (measured at the air outlet, mechanical cooling, under normal load)
temperature uniformity	≤±2℃
standard load	10KG aluminum block, 500W load;

Test standard

GB/T5170.2-2008 Temperature test equipment

GB/2423.1-2008 (IEC60068-2-1:2007) low temperature test method AB.

GB/2423.2-2008 (IEC60068-2-2:2007) high temperature test method BA.

GJBl50.3 (MIL-STD-810D) high temperature test method.

GJBl50.4 (MIL-STD-810D) low temperature test method.

SATA Customized Chip High and Low Temperature Accelerated Aging Chamber 72 Pieces