SATA Customized Chip High and Low Temperature Accelerated Aging Chamber 72 Pieces

دسته‌بندی آزمایشگر تراشه

سیستم آزمایش هوشمند دیسک حالت جامد

مدل:HD-72-NVME

قیمت:FOB, CIF

پرداخت:L/C, D/P, T/T

بسته بندی:هر مجموعه با فیبر رزین و فیلم PP محافظت شده، سپس داخل جعبه چوبی محکم قرار می‌گیرد و در داخل آن دستورالعمل عملیات و ویدئویی قرار دارد.

تحویل:۱۵ روز پس از سفارش.

ویژگی‌ها

Support the customization of the number of SATA mass production test pieces, such as 30 pieces, 36 pieces, 42 pieces, 48 pieces, 54 pieces, 72 pieces, 100 pieces, 160 pieces, 200 pieces, etc.;
Support research and development of micro-miniature customization, such as 6 pieces, 12 pieces, etc.;
Support (-70°~+ 180°) test;
Support abnormal power failure test and aging test;
Support automatic temperature control test;
Support all software for intelligent control testing;
پشتیبانی از سفارش‌سازی نرم‌افزار آزمایش؛
Support the balance of air speed and temperature in the box;
پشتیبانی از کنترل سریع گرم‌کردن و سردکردن؛
Support customized research and development of PCIE/EMMC/UFS/DRAM/Flash aging;
Support network control, you can control the test in different places and view the test results;
Support APP remote control testing;

دامنه دما	-70℃~150℃
تغییر دما	≤±0.5℃ ≤±1℃
temperature offset	≤±2℃
temperature resolution	0.01℃
سرعت گرمایش	5℃/min(mechanical cooling, under standard load)
temperature change rate	High temperature can meet 5℃~8℃/min nonlinear adjustable (measured at the air outlet, mechanical refrigeration, under standard load), low temperature can meet 0℃~2℃/min nonlinear Adjustable (measured at the air outlet, mechanical cooling, under normal load)
temperature uniformity	≤±2℃
standard load	10KG aluminum block, 500W load;

GB/T5170.2-2008 Temperature test equipment

GB/2423.1-2008 (IEC60068-2-1:2007) low temperature test method AB.

GB/2423.2-2008 (IEC60068-2-2:2007) high temperature test method BA.

GJBl50.3 (MIL-STD-810D) high temperature test method.

GJBl50.4 (MIL-STD-810D) low temperature test method.