SATA Customized Chip High and Low Temperature Accelerated Aging Chamber 72 Pieces

Categoria Tester di chip

Sistema intelligente di test per dischi a stato solido

Modello:HD-72-NVME

Prezzo:FOB, CIF

Pagamento:L/C, D/P, T/T

Confezione:Ogni set è protetto con fibra di resina e pellicola PP, quindi viene inserito in una cassa di legno robusta con manuale d'uso e video all'interno.

Consegna:15 giorni dopo l'ordine.

Caratteristica

Support the customization of the number of SATA mass production test pieces, such as 30 pieces, 36 pieces, 42 pieces, 48 pieces, 54 pieces, 72 pieces, 100 pieces, 160 pieces, 200 pieces, etc.;
Support research and development of micro-miniature customization, such as 6 pieces, 12 pieces, etc.;
Support (-70°~+ 180°) test;
Support abnormal power failure test and aging test;
Support automatic temperature control test;
Support all software for intelligent control testing;
Supporto alla personalizzazione del software di test;
Support the balance of air speed and temperature in the box;
Supporto per il controllo rapido del riscaldamento e del raffreddamento;
Support customized research and development of PCIE/EMMC/UFS/DRAM/Flash aging;
Support network control, you can control the test in different places and view the test results;
Support APP remote control testing;

Information

Modello	HD-72-SATA
Dimensioni della scatola interna	W500×D400×H1020mm
Dimensioni della scatola esterna	About W1250×D1350×H1910mm
volume	204L
Metodo di apertura	Single door (right open)
cooling method	air-cooled
Peso	About 930KG
alimentazione elettrica	AC 220V About 12KW

Temperature parameter

intervallo di temperatura	-70℃~150℃
Fluttuazione della temperatura	≤±0,5℃ ≤±1℃
temperature offset	≤±2℃
temperature resolution	0,01℃
Velocità di riscaldamento	5℃/min(mechanical cooling, under standard load)
temperature change rate	High temperature can meet 5℃~8℃/min nonlinear adjustable (measured at the air outlet, mechanical refrigeration, under standard load), low temperature can meet 0℃~2℃/min nonlinear Adjustable (measured at the air outlet, mechanical cooling, under normal load)
temperature uniformity	≤±2℃
standard load	10KG aluminum block, 500W load;

Test standard

GB/T5170.2-2008 Temperature test equipment

GB/2423.1-2008 (IEC60068-2-1:2007) low temperature test method AB.

GB/2423.2-2008 (IEC60068-2-2:2007) high temperature test method BA.

GJBl50.3 (MIL-STD-810D) high temperature test method.

GJBl50.4 (MIL-STD-810D) low temperature test method.

SATA Customized Chip High and Low Temperature Accelerated Aging Chamber 72 Pieces