SATA Customized Chip High and Low Temperature Accelerated Aging Chamber 72 Pieces

Categoría Probador de chips

Sistema Inteligente de Pruebas para Discos de Estado Sólido

Modelo:HD-72-NVME

Precio:FOB, CIF

Pago:L/C, D/P, T/T

Embalaje:Cada conjunto está protegido con fibra de resina y película de PP, luego se coloca en una caja de madera resistente con manual de operación y video en su interior.

Entrega:15 días después del pedido.

Característica

Support the customization of the number of SATA mass production test pieces, such as 30 pieces, 36 pieces, 42 pieces, 48 pieces, 54 pieces, 72 pieces, 100 pieces, 160 pieces, 200 pieces, etc.;
Support research and development of micro-miniature customization, such as 6 pieces, 12 pieces, etc.;
Support (-70°~+ 180°) test;
Support abnormal power failure test and aging test;
Support automatic temperature control test;
Support all software for intelligent control testing;
Soporte para la personalización del software de prueba;
Support the balance of air speed and temperature in the box;
Admite el control rápido de calentamiento y enfriamiento.
Support customized research and development of PCIE/EMMC/UFS/DRAM/Flash aging;
Support network control, you can control the test in different places and view the test results;
Support APP remote control testing;

Information

Modelo	HD-72-SATA
Tamaño de la caja interna	W500×D400×H1020mm
Tamaño de la caja exterior	About W1250×D1350×H1910mm
volume	204L
Método de apertura	Single door (right open)
cooling method	air-cooled
peso	About 930KG
fuente de alimentación	AC 220V About 12KW

Temperature parameter

rango de temperatura	-70℃~150℃
Fluctuación de temperatura	≤±0.5℃ ≤±1℃
temperature offset	≤±2℃
temperature resolution	0,01℃
Velocidad de calentamiento	5℃/min(mechanical cooling, under standard load)
temperature change rate	High temperature can meet 5℃~8℃/min nonlinear adjustable (measured at the air outlet, mechanical refrigeration, under standard load), low temperature can meet 0℃~2℃/min nonlinear Adjustable (measured at the air outlet, mechanical cooling, under normal load)
temperature uniformity	≤±2℃
standard load	10KG aluminum block, 500W load;

Test standard

GB/T5170.2-2008 Temperature test equipment

GB/2423.1-2008 (IEC60068-2-1:2007) low temperature test method AB.

GB/2423.2-2008 (IEC60068-2-2:2007) high temperature test method BA.

GJBl50.3 (MIL-STD-810D) high temperature test method.

GJBl50.4 (MIL-STD-810D) low temperature test method.

SATA Customized Chip High and Low Temperature Accelerated Aging Chamber 72 Pieces