SATA Customized Chip High and Low Temperature Accelerated Aging Chamber 72 Pieces

Kategoria Testerek chipów

Inteligentny system testowy dysków półprzewodnikowych

Model:HD-72-NVME

Cena:FOB, CIF

Płatność:L/C, D/P, T/T

Opakowanie:Każdy zestaw zabezpieczony włóknem żywicznym i folią PP, następnie umieszczony w mocnym drewnianym opakowaniu z instrukcją obsługi i filmem wewnątrz.

Dostawa:15 dni po złożeniu zamówienia.

Cechy

Support the customization of the number of SATA mass production test pieces, such as 30 pieces, 36 pieces, 42 pieces, 48 pieces, 54 pieces, 72 pieces, 100 pieces, 160 pieces, 200 pieces, etc.;
Support research and development of micro-miniature customization, such as 6 pieces, 12 pieces, etc.;
Support (-70°~+ 180°) test;
Support abnormal power failure test and aging test;
Support automatic temperature control test;
Support all software for intelligent control testing;
Obsługa dostosowywania oprogramowania testowego;
Support the balance of air speed and temperature in the box;
Obsługa szybkiej kontroli nagrzewania i chłodzenia;
Support customized research and development of PCIE/EMMC/UFS/DRAM/Flash aging;
Support network control, you can control the test in different places and view the test results;
Support APP remote control testing;

Information

Model	HD-72-SATA
Rozmiar skrzyni wewnętrznej	W500×D400×H1020mm
Rozmiar zewnętrznej pudełka	About W1250×D1350×H1910mm
volume	204L
Sposób otwierania	Single door (right open)
cooling method	air-cooled
Waga	About 930KG
Zasilanie	AC 220V About 12KW

Temperature parameter

zakres temperatury	-70℃~150℃
Wahania temperatury	≤±0,5℃ ≤±1℃
temperature offset	≤±2℃
temperature resolution	0,01℃
Tempo ogrzewania	5℃/min(mechanical cooling, under standard load)
temperature change rate	High temperature can meet 5℃~8℃/min nonlinear adjustable (measured at the air outlet, mechanical refrigeration, under standard load), low temperature can meet 0℃~2℃/min nonlinear Adjustable (measured at the air outlet, mechanical cooling, under normal load)
temperature uniformity	≤±2℃
standard load	10KG aluminum block, 500W load;

Test standard

GB/T5170.2-2008 Temperature test equipment

GB/2423.1-2008 (IEC60068-2-1:2007) low temperature test method AB.

GB/2423.2-2008 (IEC60068-2-2:2007) high temperature test method BA.

GJBl50.3 (MIL-STD-810D) high temperature test method.

GJBl50.4 (MIL-STD-810D) low temperature test method.

SATA Customized Chip High and Low Temperature Accelerated Aging Chamber 72 Pieces